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1
Out of the Box2
Get To Know the Hardware3
Plug It In4
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NXP analog product development boards provide an easy-to-use platform to evaluate NXP products. The board supports a range of analog, mixed-signal and power solutions. They incorporate monolithic integrated circuits (ICs) and system-in-package (SiP) devices based on proven high-volume technologies. NXP products are designed to deliver longer battery life, smaller form factor, reduced component counts, lower costs and improved performance in powering state-of-the-art systems.
This guide walks you through the process of setting up and using the RDGD31303PHG2EVB evaluation board (EVB).
The kit's contents include:
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In addition to the kit contents, the following hardware is recommended when working with this reference board.
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This reference design requires a Windows PC workstation. You will need a Windows PC workstation to evaluate the board. For best results, please ensure that your PC is equipped with the following: USB-enabled PC with Windows 11 installed.
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Installing software is necessary to work with this reference design. Software can be found at the RDGD31303PHG2EVB page.
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This section covers the features/components and provides a full description of the RDGD31303PHG2EVB. Refer to Figure 1 in this section to view how the board is oriented.
Features of the RDGD31303PHG2EVB include:
J3 and J4 jumper configurations and KITGD31XXTREVM with FlexGUI 2 software (some functions are limited to phase W); see phase schematics and FlexGUI 2 Pulse tab (Table 5 and Figure 14)Something went wrong! Please try again.
The RDGD31303PHG2EVB is a fully functional three-phase inverter evaluation board populated with six GD3130 gate drivers with fault management and supporting circuitry. This board supports SPI daisy chain communication for programming and communication with three high-side gate drivers and three low-side gate drivers independently. The board can be used with KITGD31XXTREVM MCXA153 small evaluation MCU board kit, or can be used with S32K396-HPWR-MC MCU for full inverter platforms development.
This board has low-voltage isolation and high-voltage isolation with gate drive integrated galvanic signal isolation. Additional supporting features on the board include desaturation-based short-circuit detection, IGBT/SiC temperature sensing and DC-link voltage monitoring. See GD3130 data sheet for all additional gate drive features.
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Below are full descriptions of the RDGD31303PHG2EVB board components. Refer to the images and tables provided in this section for a comprehensive overview of the board and how the components work.
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Low-voltage domain is an externally supplied 12 V DC (VPWR) primary supply for non-isolated circuits, typically supplied by a vehicle battery. A 5 V regulator supplies VDD to GD3130 gate drive devices derived from 1VPWR. The low-voltage domain includes the interface between the MCU and GD3130 control registers and logic control.
Low-side driver and high-side driver domains are isolated high-voltage driver control domains for SiC MOSFET or IGBT single phase connections and control circuits. Mill-Max pins (part number 0405-0-15-15-34-27-04-0) can be installed on the bottom of the board to connect easily to a compatible three-phase SiC MOSFET or IGBT module.
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See GD3130 advanced IGBT/SiC gate driver data sheet for specific information about pinout, pin descriptions, specifications and operating modes. The P2 VPWR terminal supplies DC power to the nonisolated die and related circuitry in the low-voltage domain. The input is typically supplied by vehicle battery +12 V DC.
The 2 × 23-pin P1 connector interfaces with the S32K396-HPWR-MC control board or another compatible MCU board. . An MCU is needed for SPI communication and control of advanced IGBT/SiC gate drive devices (GD3130).
The KITGD31XXTREVM (not included) can be connect to this board at J1 header pin interface. FlexGUI 2 provides SPI access to all six gate drivers.
Note: Double-pulse and short-circuit tests can be conducted on any phase using FlexGUI 2; see Figure 14 and Table 5.
The following diagram and tables detail the board's connections.
Figure 3. Gate Driver Board Interface Connections Diagram
Table 1: P1 Connector Pin Definitions for S32K396_HPWR_MC Board.
| Pin | Name | Function |
|---|---|---|
| 1 | GSENHU | Gate-strength enable high-side (HS) phase U |
| 2 | GSENLU | Gate-strengthenable low-side (LS) phase U |
| 3 | GSENHV | Gate-strength enable HS phase V |
| 4 | GSENLV | Gate-strength enable LS phase V |
| 5 | GSENHW | Gate-strength enable HS phase W |
| 6 | GSENLW | Gate-strength enable LS phase W |
| 7 | INTA_GD_UH | Fault indicator HS phase U |
| 8 | INTA_GD_UL | Fault indicator LS phase U |
| 9 | INTA_GD_VH | Fault indicator HS phase V |
| 10 | INTA_GD_VL | Fault indicator LS phase V |
| 11 | INTA_GD_WH | Fault indicator HS phase W |
| 12 | INTA_GD_WL | Fault indicator LS phase W |
| 13 | SCLK_GD_HS | SPI HS clock |
| 14 | DGND | Low-voltage domain digital ground |
| 15 | MISO_GD_HS | SPI HS controller input target output |
| 16 | SCLK_GD_LS | SPI LS clock |
| 17 | MOSI_GD_HS | SPI HS controller output target input |
| 18 | MISO_GD_LS | SPI LS controller input target output |
| 19 | CS_GD_HS | SPI HS chip select |
| 20 | MOSI_GD_LS | SPI LS controller output target input |
| 21 | FSS_HS | Fail-safe-state HS |
| 22 | CS_GD_LSn | SPI LS chip select |
| 23 | MCU_EN_FLYBK_HS | Flyback enable for HS |
| 24 | MCU_EN_FLYBK_LS | Flyback enable for LS |
| 25 | VDDA | Analog supply for 5 V DC measurement |
| 26 | FSENB_n | Active-low fail-safe-state for HS and LS |
| 27 | VBUSDIVbyX | Bus voltage measurement |
| 28 | FSS_LS | Fail-safe-state LS |
| 29 | AGND | Analog ground |
| 30 | VGD_LDO | Power supply for low side logic |
| 31 | INTB_GD_HSn | HS fault indicator |
| 32 | INTB_GD_LSn | LS fault indicator |
| 33 | DGND | Digital ground |
| 34 | VDDIO | Power supply for HS logic |
| 35 | AOUT_GD_UH | Analog output (AOUT) pin output HS phase U |
| 36 | AOUT_GD_UL | AOUT pin output for LS phase U |
| 37 | AOUT_GD_VH | AOUT pin output for HS phase V |
| 38 | AOUT_GD_VL | AOUT pin output for LS phase V |
| 39 | AOUT_GD_WH | AOUT pin output for HS phase W |
| 40 | AOUT_GD_WL | AOUT pin output for LS phase W |
| 41 | PWM_GD_UH | Pulse width modulation (PWM) input HS phase U |
| 42 | PWM_GD_UL | PWM input for LS phase U |
| 43 | PWM_GD_VH | PWM input for HS phase V |
| 44 | PWM_GD_VL | PWM input for LS phase V |
| 45 | PWM_GD_WH | PWM input for HS phase W |
| 46 | PWM_GD_WL | PWM input for LS phase W |
Table 2: J1 Connector Pin Definitions for KITGD31XXTREVM*.
| Pin | Name | Function |
|---|---|---|
| 1 | AOUT_GD_WL | AOUT pin output for LS phase W |
| 2 | GSENHW | Gate-strength enable for HS phase W |
| 3 | CS_GD_LSn | Chip select low side |
| 4 | GSENLW | Gate-strength enable for HS phase W |
| 5 | PWML | PWM input for the LS gate drivers; configurable for any phase through J3 |
| 6 | INTB_GD_LSn | Fault indicator for LS |
| 7 | MOSI_GD_LS | SPI controller output and target input for LS |
| 8 | SCLK_GD_LS | SPI clock for LS |
| 9 | MISO_GD_LS | SPI controller input and target output for LS |
| 10 | PS_EN_HS_LS | Flyback enable for HS and LS |
| 11 | FSS_LS | Fail-safe-state LS |
| 12 | DGND | Digital ground |
| 13 | FSENB_n | Active-low fail-safe-state enable for HS and LS |
| 14 | MISO_GD_HS | SPI controller input and target output for HS |
| 15 | INTA_GD_WL | Fault indicator for LS phase W |
| 16 | MOSI_GD_HS | SPI controller input and target output for HS |
| 17 | INTA_GD_WH | Fault indicator for HS phase W |
| 18 | CS_GD_HSn | Chip select for high side |
| 19 | LDO_EN | 5 V for voltage regulators supplying VDDIO and VGDLDO |
| 20 | AOUT_GD_WH | AOUT pin output HS phase W |
| 21 | PWMH | PWM input for HS can jumper to any phase via J3 |
| 22 | FSS_HS | Fail-safe-state input for high side |
| 23 | DGND | Digital ground |
| 24 | INTB_GD_HSn | Fault indicator for high side |
| 25 | RTRPTR_WH | Real-time report output for HS phase W |
| 26 | RTRPTR_WL | Real-time report output for LS phase W |
*Some functions are limited to phase W
Table 3: P2 Connector Pin Definitions for External 12 V DC Power to Printed-Circuit Board (PCB).
| Pin | Name | Function |
|---|---|---|
| 1 | 12V_UNSWTCHD_L | 12 V DC input for the LS gate drivers; can be connected to the HS 12 V input |
| 2 | 12V_UNSWTCHD_H | 12 V DC input for the HS gate drivers; can be connected to the LS 12 V input |
| 3 | n.c. | Fault reporting and real-time monitoring for GD3162 LS phase W |
| 4 | n.c. | Fail-safe-state enable bar |
| 5 | GND_12V_RTRN | Fail-safe-state LS |
| 6 | GND_12V_RTRN | Fail-safe-state HS |
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Figure 4 below shows the location of various test points with each clearly marked on the board. Table 4 (immediately below Figure 4) describes each labeled test point.
Table 4: Test Points.
| Test Point Name | Function |
|---|---|
| GNDL_U | Isolated ground for LS phase U |
| VCCL_U | Isolated VCC for LS phase U |
| FSISO/AIN2L_U | Fail-safe isolation (FSISO) or AIN2 input for LS phase U (selectable using FSISO_EN) |
| GNDH_U | Isolated ground for HS phase U |
| VCCH_U | Isolated VCC for HS phase U |
| AINH_U | Analog input (AIN) for HS phase U |
| GNDL_V | Isolated ground for LS phase V |
| FSISO/AIN2L_V | FSISO or AIN2 input for LS phase V (selectable via FSISO_EN) |
| VCCL_V | Isolated VCC for LS phase V |
| AINH_V | AIN for HS phase V |
| GNDH_V | Isolated ground for HS phase V |
| VCCH_V | Isolated VCC for HS phase V |
| FSISO/AIN2L_W | FSISO or AIN2 input LS phase W (selectable via FSISO_EN) |
| GNDL_W | Isolated ground LS phase W |
| VCCL_W | Isolated VCC LS phase W |
| AINH_W | AIN analog input HS phase W |
| GNDH_W | Isolated ground HS phase W |
| VCCH_W | Isolated VCC HS phase W |
| LS SPI | PCB test points for LS SPI (low-voltage domain) |
| HS SPI | PCB test points for HS SPI (low-voltage domain) |
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Figure 5 below identifies the connectors and jumpers. Table 5 (immediately below Figure 5) describes each labeled jumper.
Table 5: RDGD31303PHG2EVB Connectors and Jumpers Descriptions.
| Name | Description |
|---|---|
| P2 (For use with KITGD31XXTREVM and S32K396-HPWR-MC) |
External 12 V DC power-supply connection compatible with the S32K396-HPWR-MC control board. Connect 12 V DC to the RDGD31303PHG2EVB as follows:
|
| P1 (For use with S32K396-HPWR-MC) | 46-pinheader connector compatible with S32K396-HPWR-MC (MCU control board) |
J1 (For use with KITGD31XXTREVM) |
26-pinheader connector compatible with KITGD31XXTREVM (MCU and translator kit); enables ability to access all gate drivers high side and low side via (x3 - 2 channel) daisy chain* |
J2 (For use with KITGD31XXTREVM) |
Connects the high-side and low-side serial peripheral interface (SPI) clock signals to the MCXA153 SPI clock. Use only with the KITGD31XXTREVM |
J3 (For use with KITGD31XXTREVM) |
Selects the LS phase that receives the PWML signal when using the KITGD31XXTREVM for double-pulse and short-circuit testing:
|
J4 (For use with KITGD31XXTREVM) |
Selects the high-side phase that receives the PWMH signal when using the KITGD31XXTREVM for double-pulse and short-circuit testing:
|
*Some signals are limited to phase W
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The following list describes each gate-driver resistor and its function:
The following figures and tables detail the gate drive resistors and pin connections.
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Table 6. SiC Module Pin Connections.
| Connection name | Pin description |
|---|---|
| D6 | Drain for LS phase W |
| S6_1 | Source 1 for LS phase W |
| G6 | Gate for LS phase W |
| S6_2 | Source 2 for LS phase W |
| D4 | Drain LS for phase V |
| S4_1 | Source 1 for LS phase V |
| G4 | Gate for LS phase V |
| S4_2 | Source for LS phase V |
| D2 | Drain for LS phase U |
| S2_1 | Source 1 for LS phase U |
| G2 | Gate for LS phase U |
| S2_2 | Source 2 for LS phase U |
| S5_1 | Source 1 for HS phase W |
| G5 | Gate for HS phase W |
| S5_2 | Source 2 for HS phase W |
| D5 | Drain for HS phase W |
| S3_1 | Source 1 for HS phase V |
| G3 | Gate for HS phase V |
| S3_2 | Source 2 for HS phase V |
| D3 | Drain for HS phase V |
| S1_1 | Source 1 for HS phase U |
| G1 | Gate for HS phase U |
| S1_2 | Source 2 for HS phase U |
| D1 | Drain for HS phase U |
| TS3+ | Temperature-sensing (TS) diode anode phase W |
| TS3- | TS diode cathode phase W |
| TS2+ | TS diode anode phase V |
| TS2- | TS diode cathode phase V |
| TS1+ | TS diode anode phase U |
| TS1- | TS diode cathode phase U |
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Download FlexGUI 2 for Windows from the FlexGUI software page. The FlexGUI 2 package includes the firmware for the FRDM-MCXA153 microcontroller unit (MCU) board
It is recommended that you install FlexGUI 2 even if you plan to control the board using another software or PWM method. With FlexGUI 2, you can verify communication and troubleshoot the board configuration.
The latest version of FlexGUI 2 supports all GD3100, GD3160, GD3162 and GD313x. It is designed to run on any Windows 11 based operating system. To install the software, follow these steps:
NXP_GD31xx_GUI_public-x.x.x.msi”NXP_GD31xx_GUI_publicNote: The installer replaces any previous FlexGUI installation with the current version containing the GD31xx drivers. However, existing spi configuration files will remain intact.
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Refer to Figure 9 and the instructions below to configure the microcode for the FRDM-MCXA153.
To program the latest firmware on the FRDM-MCXA153 board, download and install LinkServer for Windows from the LinkServer page.
J15, on the FRDM-MCXA153 boardflexgui2_fw_mcxa153_gd31xx_public_vx.x.x.bin
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Connect the RDGD31303PHG2EVB to a compatible HybridPACK Drive G2 silicon carbide metal-oxide-semiconductor field-effect transistor (SiC MOSFET) module and DC-link capacitor, as shown in Figure 11. You can then use FlexGUI 2 on a Windows PC to perform double-pulse and short-circuit testing.
The following equipment is recommended for the test configuration:
Connect the cables and power supply as follows:
J1 of RDGD31303PHG2EVBConnect the RDGD31303PHG2EVB to a compatible HybridPACK Drive G2 silicon carbide metal-oxide-semiconductor field-effect transistor (SiC MOSFET) module and DC-link capacitor, as shown in Figure 11. You can then use FlexGUI 2 on a Windows PC to perform double-pulse and short-circuit testing.
The following equipment is recommended for the test configuration:
Connect the cables and power supply as follows:
J1 of RDGD31303PHG2EVBSomething went wrong! Please try again.
The resources listed below have been curated to support you through the evaluation and development process.
For additional support, please refer to the following resources: