PTN3222DHN/Q900X

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of PTN3222DHN/Q900XLast Revision (GMT):
Thursday, 11 December 2025, 08:06:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
PTN3222DHN/Q900XSOT2225DVQFN1210.554550 mg YesYesYesNickel/Palladium/Gold (Ni/Pd/Au)Cu alloye4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9354 596 671152025-12-15C1 / Unlimited26030 sec.1 / Unlimited24020 sec.3Bangkok, Thailand
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - CuPdAuBonding Wire - CuPdAuCopper and its compoundsCopper, metal7440-50-80.00289796.5500000.027443
Gold and its compoundsGold, metal7440-57-50.0000100.3500000.000100
Palladium and its compoundsPalladium, metal7440-05-30.0000933.1000000.000881
Subtotal0.003000100.00000000.028424
Copper Lead-Frame, Pre-Plated NiPdAuCopper AlloyCopper and its compoundsCopper, metal7440-50-82.99398797.83400028.366786
Iron and its compoundsIron, metal7439-89-60.0642662.1000000.608891
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0000310.0010000.000290
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.0004590.0150000.004349
Zinc and its compoundsZinc, metal7440-66-60.0015300.0500000.014497
Subtotal3.060272100.000000028.994813
Gold PlatingGold and its compoundsGold, metal7440-57-50.00099999.9900000.009474
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000001
Subtotal0.001000100.00000000.009475
Nickel PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000020.0100000.000023
Nickel and its compoundsNickel, metal7440-02-00.02447699.9900000.231895
Subtotal0.024478100.00000000.231918
Palladium PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000001
Palladium and its compoundsPalladium, metal7440-05-30.00099999.9900000.009474
Subtotal0.001000100.00000000.009475
Die EncapsulantDie EncapsulantEpoxy ResinsProprietary Material-Other Epoxy resins0.4013406.0000003.802531
Inorganic Silicon compoundsSilica, vitreous60676-86-05.73247385.70000054.312813
Inorganic Silicon compoundsSilicon dioxide7631-86-90.3678955.5000003.485653
Inorganic compoundsCarbon Black1333-86-40.0200670.3000000.190127
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins0.1672252.5000001.584388
Subtotal6.689000100.000000063.375511
Epoxy AdhesiveEpoxy AdhesiveInorganic Silicon compoundsSilicon dioxide7631-86-90.02925075.0000000.277132
Organic compoundsOther organic compounds.0.0005851.5000000.005543
PolymersPlastic: EP - Epoxide, Epoxy0.00916523.5000000.086835
Subtotal0.039000100.00000000.369509
Semiconductor DieDie SubstrateInorganic Silicon compoundsSilicon7440-21-30.72206498.0000006.841258
Miscellaneous substancesProprietary Material-Other miscellaneous substances.0.0147362.0000000.139618
Subtotal0.736800100.00000006.980875
Total10.554550100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 PTN3222DHN/Q900X
Product content declaration of PTN3222DHN/Q900X
上次修订 Last Revision (GMT):
Thursday, 11 December 2025, 08:06:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)邻苯二甲酸二正丁酯(DBP)邻苯二甲酸二异丁酯(DIBP)邻苯二甲酸丁基苄酯(BBP)邻苯二甲酸二(2-乙基)己酯(DEHP)
键合线-铜钯金
Bonding Wire - CuPdAu
键合线-铜钯金
Bonding Wire - CuPdAu
OOOOOO
铜引线框架,预镀镍钯金
Copper Lead-Frame, Pre-Plated NiPdAu
铜合金
Copper Alloy
OOOOOO

镀金材料
Gold Plating
OOOOOO

镀镍层
Nickel Plating
OOOOOO

钯镀层
Palladium Plating
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
半导体芯片
Semiconductor Die
模具基板
Die Substrate
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of PTN3222DHN/Q900XLast Revision (GMT):
Thursday, 11 December 2025, 08:06:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - CuPdAuTest Report
18 Dec 2024
Test Report
18 Dec 2024
Test Report
18 Dec 2024
Test Report
18 Dec 2024
Copper Lead-Frame, Pre-Plated NiPdAuAU PLATINGTest Report
9 Dec 2024
Test Report
9 Dec 2024
Test Report
9 Dec 2024
Test Report
9 Dec 2024
C194Test Report
20 Jan 2025
Test Report
20 Jan 2025
Test Report
20 Jan 2025
Test Report
20 Jan 2025
NI PLATINGTest Report
5 Dec 2025
Test Report
5 Dec 2025
Test Report
5 Dec 2025
Test Report
5 Dec 2025
PD PLATINGTest Report
5 Dec 2025
Test Report
5 Dec 2025
Test Report
5 Dec 2025
Test Report
5 Dec 2025
Die EncapsulantNot AvailableNot AvailableNot AvailableNot Available
Epoxy AdhesiveTest Report
10 Dec 2024
Test Report
10 Dec 2024
Test Report
10 Dec 2024
Test Report
10 Dec 2024
Semiconductor DieNot AvailableNot AvailableNot AvailableNot Available
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.