MPF5302BMMAAESR2

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MPF5302BMMAAESR2Last Revision (GMT):
Friday, 31 July 2026, 08:45:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MPF5302BMMAAESR2SOT2283WQFN2440.580000 mg YesYesYesTin (Sn)Cu alloye3contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9354 678 785182026-06-29B3 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Copper Lead-Frame, Pre-Plated AgCopper AlloyCopper and its compoundsCopper, metal7440-50-820.87767095.91040051.448177
Inorganic Silicon compoundsSilicon7440-21-30.1240550.5699000.305705
Magnesium and its compoundsMagnesium, metal7439-95-40.0391820.1800000.096556
Nickel and its compoundsNickel, metal7440-02-00.7269823.3397001.791479
Subtotal21.767890100.000000053.641917
Silver PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000240.0100000.000060
Silver and its compoundsSilver, metal7440-22-40.24208699.9900000.596564
Subtotal0.242110100.00000000.596624
Die EncapsulantDie EncapsulantEpoxy ResinsProprietary Material-Other Epoxy resins0.3047502.5000000.750986
Inorganic Silicon compoundsSilica, vitreous60676-86-09.75200080.00000024.031543
Inorganic Silicon compoundsSilicon dioxide7631-86-91.1580509.5000002.853746
Inorganic compoundsCarbon Black1333-86-40.0609500.5000000.150197
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins0.9142507.5000002.252957
Subtotal12.190000100.000000030.039428
Post-plating - Lead FreePost-plating - Lead FreeLead and its compoundsLead, metallic lead and lead alloys7439-92-10.0003800.0200000.000936
Tin and its compoundsTin, metal7440-31-51.89962099.9800004.681173
Subtotal1.900000100.00000004.682109
Semiconductor DiePolyimide CoatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0021191.0000000.005223
PolymersPolyimide Resin39355-34-50.20981799.0000000.517046
Subtotal0.211936100.00000000.522268
Redistribution MetalCopper and its compoundsCopper, metal7440-50-80.32475599.9900000.800285
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000320.0100000.000080
Subtotal0.324788100.00000000.800365
Semiconductor DieInorganic Silicon compoundsSilicon7440-21-33.54240498.0000008.729434
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0722942.0000000.178152
Subtotal3.614698100.00000008.907586
Solder BumpsSilver and its compoundsSilver, metal7440-22-40.0022261.8000000.005485
Tin and its compoundsTin, metal7440-31-50.12142398.2000000.299220
Subtotal0.123649100.00000000.304704
Sputter 1Copper and its compoundsCopper, metal7440-50-80.00097379.5374000.002399
Titanium and its compoundsTitanium, metal7440-32-60.00025020.4626000.000617
Subtotal0.001224100.00000000.003016
Sputter 2Copper and its compoundsCopper, metal7440-50-80.00721779.5374000.017786
Titanium and its compoundsTitanium, metal7440-32-60.00185720.4626000.004576
Subtotal0.009074100.00000000.022362
Under Bump MetalCopper and its compoundsCopper, metal7440-50-80.18009392.5311000.443797
Nickel and its compoundsNickel, metal7440-02-00.0145377.4689000.035822
Subtotal0.194630100.00000000.479620
Total40.580000100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MPF5302BMMAAESR2
Product content declaration of MPF5302BMMAAESR2
上次修订 Last Revision (GMT):
Friday, 31 July 2026, 08:45:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)邻苯二甲酸二正丁酯(DBP)邻苯二甲酸二异丁酯(DIBP)邻苯二甲酸丁基苄酯(BBP)邻苯二甲酸二(2-乙基)己酯(DEHP)
铜引线框架,预镀银
Copper Lead-Frame, Pre-Plated Ag
铜合金
Copper Alloy
OOOOOOOOOO

镀银
Silver Plating
OOOOOOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOOOOOO
封装后电镀- 无铅
Post-plating - Lead Free
封装后电镀- 无铅
Post-plating - Lead Free
OOOOOOOOOO
半导体芯片
Semiconductor Die
聚酰亚胺涂料
Polyimide Coating
OOOOOOOOOO

电气再分配
Redistribution Metal
OOOOOOOOOO

半导体芯片
Semiconductor Die
OOOOOOOOOO

焊锡金属凸块
Solder Bumps
OOOOOOOOOO

溅射
Sputter 1
OOOOOOOOOO

溅射
Sputter 2
OOOOOOOOOO

焊料凸点下的金属
Under Bump Metal
OOOOOOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MPF5302BMMAAESR2Last Revision (GMT):
Friday, 31 July 2026, 08:45:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Copper Lead-Frame, Pre-Plated AgAG PLATINGNot AvailableNot AvailableNot AvailableNot Available
C7025Not AvailableNot AvailableNot AvailableNot Available
Die EncapsulantTest Report
13 Jan 2026
Test Report
13 Jan 2026
Test Report
13 Jan 2026
Test Report
13 Jan 2026
Post-plating - Lead FreeTest Report
19 Dec 2025
Test Report
19 Dec 2025
Test Report
19 Dec 2025
Test Report
19 Dec 2025
Semiconductor DieCU PILLARNot AvailableNot AvailableNot AvailableNot Available
DIENot AvailableNot AvailableNot AvailableNot Available
LTC9320E07Not AvailableNot AvailableNot AvailableNot Available
UBM_RDL CUNot AvailableNot AvailableNot AvailableNot Available
UBM_RDL CU PLATINGNot AvailableNot AvailableNot AvailableNot Available
UBM_RDL TINot AvailableNot AvailableNot AvailableNot Available
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.