LPCOpen Platform
LPCOpen Platform for NXP LPC Microcontrollers
 All Data Structures Files Functions Variables Typedefs Enumerations Enumerator Macros Groups Pages
mem_tests.h
Go to the documentation of this file.
1 /*
2  * @brief Generic memory tests
3  * Various memory tests for testing external memory integrity. Includes
4  * inverse address, walking bit, and pattern tests.
5  *
6  * @note
7  * Copyright(C) NXP Semiconductors, 2012
8  * All rights reserved.
9  *
10  * @par
11  * Software that is described herein is for illustrative purposes only
12  * which provides customers with programming information regarding the
13  * LPC products. This software is supplied "AS IS" without any warranties of
14  * any kind, and NXP Semiconductors and its licensor disclaim any and
15  * all warranties, express or implied, including all implied warranties of
16  * merchantability, fitness for a particular purpose and non-infringement of
17  * intellectual property rights. NXP Semiconductors assumes no responsibility
18  * or liability for the use of the software, conveys no license or rights under any
19  * patent, copyright, mask work right, or any other intellectual property rights in
20  * or to any products. NXP Semiconductors reserves the right to make changes
21  * in the software without notification. NXP Semiconductors also makes no
22  * representation or warranty that such application will be suitable for the
23  * specified use without further testing or modification.
24  *
25  * @par
26  * Permission to use, copy, modify, and distribute this software and its
27  * documentation is hereby granted, under NXP Semiconductors' and its
28  * licensor's relevant copyrights in the software, without fee, provided that it
29  * is used in conjunction with NXP Semiconductors microcontrollers. This
30  * copyright, permission, and disclaimer notice must appear in all copies of
31  * this code.
32  */
33 
34 #ifndef __MEM_TESTS_H_
35 #define __MEM_TESTS_H_
36 
37 #include "lpc_types.h"
38 
47 typedef struct {
54 
62 bool mem_test_walking0(MEM_TEST_SETUP_T *pMemSetup);
63 
71 bool mem_test_walking1(MEM_TEST_SETUP_T *pMemSetup);
72 
80 bool mem_test_address(MEM_TEST_SETUP_T *pMemSetup);
81 
89 bool mem_test_invaddress(MEM_TEST_SETUP_T *pMemSetup);
90 
98 bool mem_test_pattern(MEM_TEST_SETUP_T *pMemSetup);
99 
110 bool mem_test_pattern_seed(MEM_TEST_SETUP_T *pMemSetup, uint32_t seed, uint32_t incr);
111 
116 #endif /* __MEM_TESTS_H_ */