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CHIP: Various RAM memory tests

Data Structures

struct  MEM_TEST_SETUP_T
 Memory test address/size and result structure. More...
 

Functions

bool mem_test_walking0 (MEM_TEST_SETUP_T *pMemSetup)
 Walking 0 memory test.
 
bool mem_test_walking1 (MEM_TEST_SETUP_T *pMemSetup)
 Walking 1 memory test.
 
bool mem_test_address (MEM_TEST_SETUP_T *pMemSetup)
 Address memory test.
 
bool mem_test_invaddress (MEM_TEST_SETUP_T *pMemSetup)
 Inverse address memory test.
 
bool mem_test_pattern (MEM_TEST_SETUP_T *pMemSetup)
 Pattern memory test.
 
bool mem_test_pattern_seed (MEM_TEST_SETUP_T *pMemSetup, uint32_t seed, uint32_t incr)
 Pattern memory test with seed and increment value.
 

Detailed Description

Function Documentation

bool mem_test_address ( MEM_TEST_SETUP_T pMemSetup)

Address memory test.

Parameters
pMemSetup: Memory test setup (and returned results)
Returns
true if the test passed, or false on failure Writes the address to each memory location and verifies the result after all memory locations are written

Definition at line 145 of file mem_tests.c.

bool mem_test_invaddress ( MEM_TEST_SETUP_T pMemSetup)

Inverse address memory test.

Parameters
pMemSetup: Memory test setup (and returned results)
Returns
true if the test passed, or false on failure Writes the inverse address to each memory location and verifies the result after all memory locations are written

Definition at line 181 of file mem_tests.c.

bool mem_test_pattern ( MEM_TEST_SETUP_T pMemSetup)

Pattern memory test.

Parameters
pMemSetup: Memory test setup (and returned results)
Returns
true if the test passed, or false on failure Writes the an alternating 0x55/0xAA pattern to each memory location and verifies the result after all memory locations are written

Definition at line 217 of file mem_tests.c.

bool mem_test_pattern_seed ( MEM_TEST_SETUP_T pMemSetup,
uint32_t  seed,
uint32_t  incr 
)

Pattern memory test with seed and increment value.

Parameters
pMemSetup: Memory test setup (and returned results)
seed: Initial seed value for test
incr: Increment value for each memory location
Returns
true if the test passed, or false on failure Writes the an alternating pattern to each memory location based on a passed seedn and increment value and verifies the result after all memory locations are written

Definition at line 257 of file mem_tests.c.

bool mem_test_walking0 ( MEM_TEST_SETUP_T pMemSetup)

Walking 0 memory test.

Parameters
pMemSetup: Memory test setup (and returned results)
Returns
true if the test passed, or false on failure Writes a shifting 0 bit pattern to the entire memory range and verifies the result after all memory locations are written

Definition at line 53 of file mem_tests.c.

bool mem_test_walking1 ( MEM_TEST_SETUP_T pMemSetup)

Walking 1 memory test.

Parameters
pMemSetup: Memory test setup (and returned results)
Returns
true if the test passed, or false on failure Writes a shifting 1 bit pattern to the entire memory range and verifies the result after all memory locations are written

Definition at line 99 of file mem_tests.c.